In this paper, we analyze failing circuits and propose a multiple-fault diagnosis approach. Our methodology has been validated experimentally and has proved to be highly efficient...
In this paper, we propose a diagnostic test generation method in conjunction with an efficient sequential SAT-based diagnosis procedure to precisely identify multiple defective si...
– We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and cro...
Katherine Shu-Min Li, Yao-Wen Chang, Chauchin Su, ...
Diagnosing multiple faults for a complex system is often very difficult. It requires not only a model which adequately represents the diagnostic aspect of a complex system, but al...
Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Regist...