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GLVLSI
2002
IEEE
136views VLSI» more  GLVLSI 2002»
13 years 11 months ago
Test generation for resistive opens in CMOS
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
Arun Krishnamachary, Jacob A. Abraham
ITC
1996
IEEE
96views Hardware» more  ITC 1996»
13 years 10 months ago
Analysis and Detection of Timing Failures in an Experimental Test Chip
A 25k gate Test Chip was designed and manufactured to evaluate different test methods for scan-designed circuits. The design of the chip, the experiment, and preliminary experimen...
Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin...
VTS
1998
IEEE
98views Hardware» more  VTS 1998»
13 years 10 months ago
Experimental Results for IDDQ and VLV Testing
An experimental test chip was designed and manufactured to evaluate different test techniques. Based on the results presented in the wafer probe, 309 out of 5491 dies that passed ...
Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu,...
ICRA
2005
IEEE
126views Robotics» more  ICRA 2005»
13 years 11 months ago
Detection of Sensor Faults in Autonomous Helicopters
- This paper presents a sensor fault detection and diagnosis system for autonomous helicopters. The system has been tested with the MARVIN autonomous helicopter. Fault detection is...
Guillermo Heredia, Aníbal Ollero, Rajesh Ma...
EH
2003
IEEE
136views Hardware» more  EH 2003»
13 years 11 months ago
Experimental Results in Evolutionary Fault-Recovery for Field Programmable
This paper presents experimental results of fast intrinsic evolutionary design and evolutionary fault recovery of a 4-bit Digital to Analog Converter (DAC) using the JPL stand-alo...
Ricardo Salem Zebulum, Didier Keymeulen, Vu Duong,...