18 search results - page 3 / 4 » An analytical approach for soft error rate estimation in dig... |
IOLTS
2007
IEEE
14 years 8 days ago
2007
IEEE
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
ISQED
2009
IEEE
14 years 23 days ago
2009
IEEE
With technology scaling, the occurrence rate of not only single, but also multiple transients resulting from a single hit is increasing. In this work, we consider the effect of th...
PATMOS
2007
Springer
14 years 2 days ago
2007
Springer
—Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the...
TCAD
2008
13 years 5 months ago
2008
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
TVLSI
2010
13 years 20 days ago
2010
It has been recently demonstrated that digital signal processing systems may possibly leverage unconventional voltage overscaling (VOS) to reduce energy consumption while maintaini...