Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
Yu-Shen Yang, Jiang Brandon Liu, Paul J. Thadikara...
In modern technologies, process variations can be quite substantial, often causing design timing failures. It is essential that those errors be correctly and quickly diagnosed. In...
We present DIADS, an integrated DIAgnosis tool for Databases and Storage area networks (SANs). Existing diagnosis tools in this domain have a database-only (e.g., [11]) or SAN-onl...
An incremental simulation-based approach to fault diagnosis and logic debugging is presented. During each iteration of the algorithm, a single suspicious location is identified a...
Andreas G. Veneris, Jiang Brandon Liu, Mandana Ami...
Effective system verification requires good specifications. The lack of sufficient specifications can lead to misses of critical bugs, design re-spins, and time-to-market slips. I...