22 search results - page 4 / 5 » An efficient automatic test generation system for path delay... |
TCAD
2008
13 years 5 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
DSD
2006
IEEE
13 years 11 months ago
2006
IEEE
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
ATS
1998
IEEE
13 years 10 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
INFSOF
2007
13 years 5 months ago
2007
: Correct functioning of object-oriented software depends upon the successful integration of classes. While individual classes may function correctly, several new faults can arise ...
ICCAD
1999
IEEE
13 years 10 months ago
1999
IEEE
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...