12 search results - page 3 / 3 » An experimental analysis of spot defects in SRAMs: realistic... |
ASPDAC
2009
ACM
13 years 11 months ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
ATS
2010
IEEE
13 years 2 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...