49 search results - page 1 / 10 » Analog frequency response measurement in mixed-signal system... |
ISCAS
2007
IEEE
13 years 11 months ago
2007
IEEE
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
ISCAS
2006
IEEE
13 years 11 months ago
2006
IEEE
—We present an efficient approach for on-chip frequency response measurement, including phase and gain, of analog circuitry in mixed-signal systems. The approach uses direct digi...
ISCAS
2005
IEEE
13 years 10 months ago
2005
IEEE
—We present a Built-In Self-Test (BIST) approach based on direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. DDS with Delta-S...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Multi-channel waveform monitoring technique enhances built-in test and diagnostic capability of mixed-signal VLSI circuits. An 8-channel prototype system incorporates adaptive sam...