85 search results - page 1 / 17 » Analysis and Detection of Timing Failures in an Experimental... |
ITC
1996
IEEE
13 years 9 months ago
1996
IEEE
A 25k gate Test Chip was designed and manufactured to evaluate different test methods for scan-designed circuits. The design of the chip, the experiment, and preliminary experimen...
VTS
1996
IEEE
13 years 9 months ago
1996
IEEE
Some weak static CMOS chips can be detected by testing them with a very low supply voltage -- between 2 and 2.5 times the threshold voltage Vt of the transistors. A weak chip is o...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
MR
2002
13 years 4 months ago
2002
In the flip-chip assembly process, no-flow underfill materials have a particular advantage over traditional underfill: the application and curing of the former can be undertaken b...
ETS
2011
IEEE
12 years 4 months ago
2011
IEEE
—As circuits continue to scale to smaller feature sizes, wearout and latent defects are expected to cause an increasing number of errors in the field. Online error detection tec...