14 search results - page 2 / 3 » Analytical model for TDDB-based performance degradation in c... |
ISQED
2011
IEEE
12 years 9 months ago
2011
IEEE
With continuous scaling of transistors in each technology generation, NBTI and Process Variation (PV) have become very important silicon reliability problems for the microprocesso...
PADS
2004
ACM
13 years 11 months ago
2004
ACM
Parallel discrete event simulation techniques have enabled the realization of large-scale models of communication networks containing millions of end hosts and routers. However, t...
ISLPED
2009
ACM
14 years 20 hour ago
2009
ACM
In this paper, we observe that minimum energy Emin of subthreshold logic dramatically increases when reaching 45 nm node. We demonstrate by circuit simulation and analytical model...
CVPR
2003
IEEE
14 years 7 months ago
2003
IEEE
The likelihood models used in probabilistic visual tracking applications are often complex non-linear and/or nonGaussian functions, leading to analytically intractable inference. ...
VLSID
2005
IEEE
13 years 11 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...