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» Application of Built in Self-Test for Interconnect Testing o...

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ITC
2003
IEEE

132views Hardware» more ITC 2003»

Application of Built in Self-Test for Interconnect Testing of FPGAs

13 years 10 months ago

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Dereck A. Fernandes, Ian G. Harris

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DFT
2009
IEEE

178views VLSI» more DFT 2009»

Soft Core Embedded Processor Based Built-In Self-Test of FPGAs

14 years 46 min ago

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This paper presents the first implementation of Built-In Self-Test (BIST) of Field Programmable Gate Arrays (FPGAs) using a soft core embedded processor for reconfiguration of the...

Bradley F. Dutton, Charles E. Stroud

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CSREAESA
2009

175views Embedded Systems» more CSREAESA 2009»

Built-In Self-Test of Embedded SEU Detection Cores in Virtex-4 and Virtex-5 FPGAs

13 years 6 months ago

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A Built-In Self-Test (BIST) approach is presented for the Internal Configuration Access Port (ICAP) and Frame Error Correcting Code (ECC) logic cores embedded in Xilinx Virtex-4 an...

Bradley F. Dutton, Charles E. Stroud

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ITC
2002
IEEE

143views Hardware» more ITC 2002»

BIST-Based Diagnosis of FPGA Interconnect

13 years 10 months ago

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: We present a Built-In Self-Test (BIST)-based diagnostic approach for the programmable interconnect resources in Field Programmable Gate Arrays (FPGAs) that can be used for either...

Charles E. Stroud, Jeremy Nall, Matthew Lashinsky,...

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CSREAESA
2006

130views Embedded Systems» more CSREAESA 2006»

Embedded Processor Based Built-In Self-Test and Diagnosis of Logic and Memory Resources in FPGAs

13 years 6 months ago

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Abstract

Daniel T. Milton, Sachin Dhingra, Charles E. Strou...

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