113 search results - page 3 / 23 » Architectural-Level Fault Tolerant Computation in Nanoelectr... |
CAMP
2005
IEEE
13 years 11 months ago
2005
IEEE
Abstract— The promise of next-generation computer technologies, such as nano-electronics, implies a number of serious alterations to the design flow of digital circuits. One of ...
TSE
1998
13 years 5 months ago
1998
An important step in the development of dependable systems is the validation of their fault tolerance properties. Fault injection has been widely used for this purpose, however wi...
DAC
2004
ACM
14 years 6 months ago
2004
ACM
Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the trem...
DAC
2012
ACM
11 years 7 months ago
2012
ACM
Much recent research [8, 6, 7] suggests significant power and energy benefits of relaxing correctness constraints in future processors. Such processors with relaxed constraints ...
ASAP
2005
IEEE
13 years 11 months ago
2005
IEEE
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...