Abstract—Silicon debug poses a unique challenge to the engineer because of the limited access to internal signals of the chip. Embedded hardware such as trace buffers helps overc...
Yu-Shen Yang, Brian Keng, Nicola Nicolici, Andreas...
Since pre-silicon functional verification is insufficient to detect all design errors, re-spins are often needed due to malfunctions that escape into the silicon. This paper pre...
When searching for functional bugs in silicon, debug data is acquired after a trigger event occurs. A trigger event can be configured at run-time using a set of control registers...
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
Erik Jan Marinissen, Bart Vermeulen, Robert Madge,...
We present new techniques for fast, accurate and scalable static data race detection in concurrent programs. Focusing our analysis on Linux device drivers allowed us to identify th...