78 search results - page 1 / 16 » Automatic test generation using genetically-engineered disti... |
TCAD
1998
13 years 4 months ago
1998
—New methods for fault-effect propagation and state justification that use finite-state-machine sequences are proposed for sequential circuit test generation. Distinguishing se...
VTS
1996
IEEE
13 years 8 months ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
ASE
2006
13 years 4 months ago
2006
Finite state machines have been used to model a number of classes of system and there has thus been much interest in the automatic generation of test sequences from finite state m...
DATE
1997
IEEE
13 years 8 months ago
1997
IEEE
A new method for state justi cation is proposed for sequential circuit test generation. The linear list of states dynamically obtained during the derivation of test vectors is use...
BMCBI
2007
13 years 4 months ago
2007
Background: Most single stranded RNA (ssRNA) viruses mutate rapidly to generate large number of strains having highly divergent capsid sequences. Accurate strain recognition in un...