5604 search results - page 2 / 1121 » Becoming Increasingly Reliable |
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
Chip reliability becomes a great threat to the design of future microelectronic systems with the continuation of the progressive downscaling of CMOS technologies. Hence increasing...
CICLING
2009
Springer
14 years 5 months ago
2009
Springer
Where the field has been and where it is going? It is relatively easy to know where we have been, but harder (and more valuable) to know where we are going. The title of this paper...
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
—Power and energy consumption has emerged as the premier and most constraining aspect in modern computational systems. Dynamic Voltage Scheduling (DVS) has been provably one of t...
GLVLSI
2006
IEEE
13 years 11 months ago
2006
IEEE
Reliability has become a significant challenge for system design in new process technologies. Higher integration levels dramatically increase power densities, which leads to high...
IWC
2000
13 years 5 months ago
2000
Intelligent user interfaces have been proposed as a means to overcome some of the problems that directmanipulation interfaces cannot handle, such as: information overflow problems...