55 search results - page 1 / 11 » Bounds on pseudoexhaustive test lengths |
TVLSI
1998
13 years 4 months ago
1998
Abstract—Pseudoexhaustive testing involves applying all possible input patterns to the individual output cones of a combinational circuit. Based on our new algebraic results, we ...
ITC
1989
IEEE
13 years 8 months ago
1989
IEEE
: The concept of a pseudo-exhaustive test for sequential circuits is introduced in a similar way as it is used for combinational networks. Instead of test sets one has to apply pse...
ATS
2002
IEEE
13 years 9 months ago
2002
IEEE
In this paper, we present a technique for reducing the test length of counter-based pseudo-exhaustive built-in self-testing (BIST) based on width compression method. More formally...
JSAT
2006
13 years 4 months ago
2006
We give a randomized algorithm for testing satisfiability of Boolean formulas in conjunctive normal form with no restriction on clause length. This algorithm uses the clauseshorte...
COMBINATORICA
1999
13 years 4 months ago
1999
We present a sublinear-time algorithm for testing whether a bounded degree graph is bipartite or far from being bipartite. Graphs are represented by incidence lists of bounded len...