3 search results - page 1 / 1 » Built-in self-test for automatic analog frequency response m... |
ISCAS
2005
IEEE
13 years 10 months ago
2005
IEEE
—We present a Built-In Self-Test (BIST) approach based on direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. DDS with Delta-S...
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper presents the design of an on-chip spectrum analyzer. A novel architecture is used to mitigate the problems encountered in trying to implement architectures employed in ...
ISCAS
2007
IEEE
13 years 11 months ago
2007
IEEE
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is...