74 search results - page 3 / 15 » Built-in test generation for synchronous sequential circuits |
VLSID
2003
IEEE
14 years 6 months ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
ISCAS
1999
IEEE
13 years 10 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
ICCD
2006
IEEE
13 years 11 months ago
2006
IEEE
—This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose t...
GLVLSI
1998
IEEE
13 years 10 months ago
1998
IEEE
DAC
1999
ACM
14 years 6 months ago
1999
ACM
