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11

GLVLSI
1998
IEEE

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Test Compaction for Synchronous Sequential Circuits by Test Sequence Recycling

13 years 9 months ago

Test Compaction for Synchronous Sequential Circuits by Test Sequence Recycling

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Irith Pomeranz, Sudhakar M. Reddy

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GLVLSI 1998 | VLSI |

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Added	04 Aug 2010
Updated	04 Aug 2010
Type	Conference
Year	1998
Where	GLVLSI
Authors	Irith Pomeranz, Sudhakar M. Reddy

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