21 search results - page 1 / 5 » Case Study: Soft Error Rate Analysis in Storage Systems |
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
Soft errors due to cosmic particles are a growing reliability threat for VLSI systems. In this paper we analyze the soft error vulnerability of FPGAs used in storage systems. Sinc...
VLSISP
2008
13 years 4 months ago
2008
The study of Multiple Soft errors on memory modules caused by radiation effects represents an interesting field of current research. The fault tolerance of these devices in radiati...
DSN
2007
IEEE
13 years 11 months ago
2007
IEEE
This paper concerns the validity of a widely used method for estimating the architecture-level mean time to failure (MTTF) due to soft errors. The method first calculates the fai...
IOLTS
2007
IEEE
13 years 11 months ago
2007
IEEE
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
ISSRE
2010
IEEE
13 years 3 months ago
2010
IEEE
Abstract—As smart phones grow in popularity, manufacturers are in a race to pack an increasingly rich set of features into these tiny devices. This brings additional complexity i...