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FPGA
2004
ACM
234views FPGA» more  FPGA 2004»
13 years 9 months ago
An embedded true random number generator for FPGAs
Field Programmable Gate Arrays (FPGAs) are an increasingly popular choice of platform for the implementation of cryptographic systems. Until recently, designers using FPGAs had le...
Paul Kohlbrenner, Kris Gaj
INTEGRATION
2006
102views more  INTEGRATION 2006»
13 years 5 months ago
A parameterized graph-based framework for high-level test synthesis
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
Saeed Safari, Amir-Hossein Jahangir, Hadi Esmaeilz...
IFIP
2001
Springer
13 years 9 months ago
Random Adjacent Sequences: An Efficient Solution for Logic BIST
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
René David, Patrick Girard, Christian Landr...
DATE
2003
IEEE
98views Hardware» more  DATE 2003»
13 years 10 months ago
On the Characterization of Hard-to-Detect Bridging Faults
We investigate a characterization of hard-to-detect bridging faults. For circuits with large numbers of lines (or nodes), this characterization can be used to select target faults...
Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu
COMPSEC
2004
131views more  COMPSEC 2004»
13 years 5 months ago
Biometric random number generators
Abstract Up to now biometric methods have been used in cryptography for authentication purposes. In this paper we propose to use biological data for generating sequences of random ...
Janusz Szczepanski, Elek Wajnryb, José M. A...