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TCAD
2008
115views more  TCAD 2008»
13 years 5 months ago
Statistical Thermal Profile Considering Process Variations: Analysis and Applications
The nonuniform substrate thermal profile and process variations are two major concerns in the present-day ultradeep submicrometer designs. To correctly predict performance/ leakage...
Javid Jaffari, Mohab Anis
ICCD
2005
IEEE
131views Hardware» more  ICCD 2005»
13 years 11 months ago
Efficient Thermal Simulation for Run-Time Temperature Tracking and Management
As power density increases exponentially, run-time regulation of operating temperature by dynamic thermal management becomes imperative. This paper proposes a novel approach to re...
Hang Li, Pu Liu, Zhenyu Qi, Lingling Jin, Wei Wu, ...
ASPDAC
2008
ACM
95views Hardware» more  ASPDAC 2008»
13 years 7 months ago
Statistical power profile correlation for realistic thermal estimation
At system level, the on-chip temperature depends both on power density and the thermal coupling with the neighboring regions. The problem of finding the right set of input power pr...
Love Singhal, Sejong Oh, Eli Bozorgzadeh
ASPDAC
2008
ACM
119views Hardware» more  ASPDAC 2008»
13 years 7 months ago
A stochastic local hot spot alerting technique
- With the increasing levels of variability in the behavior of manufactured nano-scale devices and dramatic changes in the power density on a chip, timely identification of hot spo...
Hwisung Jung, Massoud Pedram
ICCD
2005
IEEE
102views Hardware» more  ICCD 2005»
14 years 2 months ago
Monitoring Temperature in FPGA based SoCs
FPGA logic densities continue to increase at a tremendous rate. This has had the undesired consequence of increased power density, which manifests itself as higher ondie temperatu...
Sivakumar Velusamy, Wei Huang, John Lach, Mircea R...