Process and environmental variations continue to present significant challenges to designers of high-performance integrated circuits. In the past few years, while much research has...
Khaled R. Heloue, Chandramouli V. Kashyap, Farid N...
— Statistical static timing analysis deals with the increasing variations in manufacturing processes to reduce the pessimism in the worst case timing analysis. Because of the cor...
Bing Li, Ning Chen, Manuel Schmidt, Walter Schneid...
—We present a new technique for statistical static timing analysis (SSTA) based on Markov chain Monte Carlo (MCMC), that allows fast and accurate estimation of the right-hand tai...
Yashodhan Kanoria, Subhasish Mitra, Andrea Montana...
— A methodology is proposed for interdependent setup time and hold time characterization of sequential circuits. Integrating the methodology into an industrial sign-off static ti...
Emre Salman, Eby G. Friedman, Ali Dasdan, Feroze T...
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...