93 search results - page 2 / 19 » Classification trees for random tests and functional coverag... |
CODES
2008
IEEE
13 years 7 months ago
2008
IEEE
Functional validation is a major bottleneck in microprocessor design methodology. Simulation is the widely used method for functional validation using billions of random and biase...
VLSID
2007
IEEE
14 years 5 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
This paper describes an efficient error simulator able to analyze functional VHDL descriptions. The proposed simulation environment can be based on commercial VHDL simulators. Al...
ITC
1995
IEEE
13 years 8 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
ICANNGA
2007
Springer
13 years 9 months ago
2007
Springer
Abstract. In the paper, a new method of decision tree learning for costsensitive classification is presented. In contrast to the traditional greedy top-down inducer in the proposed...