54 search results - page 1 / 11 » Clustering based pruning for statistical criticality computa... |
ICCAD
2007
IEEE
14 years 1 months ago
2007
IEEE
— We present a new linear time technique to compute criticality information in a timing graph by dividing it into “zones”. Errors in using tightness probabilities for critica...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
Process variations cause different behavior of timingdependent effects across different chips. In this work, we analyze one example of timing-dependent effects, crosscoupling ...
ASPDAC
2009
ACM
13 years 11 months ago
2009
ACM
— Recent advances in statistical timing analysis (SSTA) achieve great success in computing arrival times under variations by extending sum and maximum operations to random variab...
DAC
2010
ACM
13 years 8 months ago
2010
ACM
With the ever-increasing transistor variability in CMOS technology, it is essential to integrate variation-aware performance analysis into the task allocation and scheduling proce...