12 search results - page 1 / 3 » CodSim -- A Combined Delay Fault Simulator |
DFT
2003
IEEE
13 years 10 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
ICCAD
1994
IEEE
13 years 8 months ago
1994
IEEE
We consider the problem of testing for delay faults in macrobased circuits. Macro-based circuits are obtained as a result of technology mapping. Gate-level fault models cannot be ...
VLSID
1996
IEEE
13 years 8 months ago
1996
IEEE
W epropose a coverage metric and a two-pass test generation method for path delay faults in combinational logic circuits. The coverage is measured for each line with a rising and ...
CSREASAM
2007
13 years 6 months ago
2007
— In this paper, we present a strategy to detect an intrusion using fault localization tools. We propose an intrusion detection system to detect a self-contained in-band wormhole...
ATS
2010
IEEE
13 years 2 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...