12 search results - page 2 / 3 » CodSim -- A Combined Delay Fault Simulator |
ATS
2000
IEEE
13 years 9 months ago
2000
IEEE
At very high frequencies, the major potential of asynchronous circuits is absence of clock skew and, through that, better exploitation of relative timing relations. This paper pre...
ET
2002
13 years 4 months ago
2002
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Faster defect localization is achieved by combining IC simulations and internal measurements. Time resolved photon emission records photons emitted during commutations (current) r...
NSDI
2008
13 years 7 months ago
2008
Much recent work on Byzantine state machine replication focuses on protocols with improved performance under benign conditions (LANs, homogeneous replicas, limited crash faults), ...
GLVLSI
2010
IEEE
13 years 10 months ago
2010
IEEE
NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...