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TVLSI
2008
140views more  TVLSI 2008»
13 years 4 months ago
A Novel Mutation-Based Validation Paradigm for High-Level Hardware Descriptions
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...
Jorge Campos, Hussain Al-Asaad
GLVLSI
2002
IEEE
108views VLSI» more  GLVLSI 2002»
13 years 9 months ago
Protected IP-core test generation
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
Alessandro Fin, Franco Fummi
DATE
2004
IEEE
131views Hardware» more  DATE 2004»
13 years 8 months ago
Testing of Quantum Dot Cellular Automata Based Designs
There has been considerable research on quantum dots cellular automata as a new computing scheme in the nano-scale regimes. The basic logic element of this technology is a majorit...
Mehdi Baradaran Tahoori, Fabrizio Lombardi
IFIP
2001
Springer
13 years 9 months ago
Functional Test Generation using Constraint Logic Programming
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
Zhihong Zeng, Maciej J. Ciesielski, Bruno Rouzeyre
DDECS
2006
IEEE
79views Hardware» more  DDECS 2006»
13 years 11 months ago
Multiple-Vector Column-Matching BIST Design Method
- Extension of a BIST design algorithm is proposed in this paper. The method is based on a synthesis of a combinational block - the decoder, transforming pseudo-random code words i...
Petr Fiser, Hana Kubatova