6 search results - page 1 / 2 » Combined circuit and microarchitecture techniques for effect... |
DSN
2008
IEEE
13 years 11 months ago
2008
IEEE
As semiconductor technology scales, reliability is becoming an increasingly crucial challenge in microprocessor design. The rSRAM and voltage scaling are two promising circuit-lev...
ISPASS
2007
IEEE
13 years 11 months ago
2007
IEEE
Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...
HPCA
2009
IEEE
13 years 12 months ago
2009
IEEE
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...
ICPP
2008
IEEE
13 years 11 months ago
2008
IEEE
The issue queue (IQ) is a key microarchitecture structure for exploiting instruction-level and thread-level parallelism in dynamically scheduled simultaneous multithreaded (SMT) p...
MICRO
2008
IEEE
13 years 11 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...