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    ATS
    2003
    IEEE
    106views Hardware» more  ATS 2003»
    Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders
    13 years 10 months ago
    Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders
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    Luigi Dilillo, Patrick Girard, Serge Pravossoudovi...
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    ET
    2007
    119views more  ET 2007»
    Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits
    13 years 4 months ago
    Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits
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    In this paper, we present an exhaustive study on the influence of resistive-open defects in pre-charge circuits of SRAM memories. In SRAM memories, the pre-charge circuits operate...
    Luigi Dilillo, Patrick Girard, Serge Pravossoudovi...
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