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» Comprehensive Evaluation of an Instruction Reissue Mechanism
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ISPAN
2000
IEEE
13 years 9 months ago
Comprehensive Evaluation of an Instruction Reissue Mechanism
In this paper, we evaluate a mechanism to reissue instructions on the mispredicted speculation path. An instruction which is once dispatched to a functional unit during mispredict...
Toshinori Sato, Itsujiro Arita
ISCAPDCS
2001
13 years 6 months ago
Tolerating Transient Faults through an Instruction Reissue Mechanism
In this paper, we propose a fault-tolerant mechanism for microprocessors, which detects transient faults and recovers from them. There are two driving force to investigate fault-t...
Toshinori Sato, Itsujiro Arita
DFT
2003
IEEE
142views VLSI» more  DFT 2003»
13 years 10 months ago
Exploiting Instruction Redundancy for Transient Fault Tolerance
This paper presents an approach for integrating fault-tolerance techniques into microprocessors by utilizing instruction redundancy as well as time redundancy. Smaller and smaller...
Toshinori Sato
DSN
2008
IEEE
13 years 11 months ago
Analysis and solutions to issue queue process variation
The last few years have witnessed an unprecedented explosion in transistor densities. Diminutive feature sizes have enabled microprocessor designers to break the billion-transisto...
Niranjan Soundararajan, Aditya Yanamandra, Chrysos...
DSN
2005
IEEE
13 years 11 months ago
Checking Array Bound Violation Using Segmentation Hardware
The ability to check memory references against their associated array/buffer bounds helps programmers to detect programming errors involving address overruns early on and thus avo...
Lap-Chung Lam, Tzi-cker Chiueh