80 search results - page 3 / 16 » Compressing Functional Tests for Microprocessors |
VLSID
2007
IEEE
14 years 6 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
EUROGP
2003
Springer
13 years 11 months ago
2003
Springer
Test programs are fragment of code, but, unlike ordinary application programs, they are not intended to solve a problem, nor to calculate a function. Instead, they are supposed to ...
ICCD
2007
IEEE
14 years 2 months ago
2007
IEEE
This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. Despite the popularity of the stuck-at fault model, it is no longer the only re...
ITC
1998
IEEE
13 years 10 months ago
1998
IEEE
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
VLSID
2007
IEEE
14 years 6 months ago
2007
IEEE
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...