10 search results - page 2 / 2 » Confidence Scalable Post-Silicon Statistical Delay Predictio... |
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
Process variation has become a major concern in the design of many nanometer circuits, including interconnect pipelines. This paper develops closed-form models to predict the dela...
ICCAD
2009
IEEE
13 years 2 months ago
2009
IEEE
In this paper, we propose a new technique, referred to as virtual probe (VP), to efficiently measure, characterize and monitor both inter-die and spatially-correlated intra-die va...
ASPDAC
2008
ACM
13 years 6 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
ICDM
2010
IEEE
13 years 2 months ago
2010
IEEE
Regression problems on massive data sets are ubiquitous in many application domains including the Internet, earth and space sciences, and finances. In many cases, regression algori...
DAC
2003
ACM
13 years 10 months ago
2003
ACM
In recent years, due to rapid advances in VLSI manufacturing technology capable of packing more and more devices and wires on a chip, crosstalk has emerged as a serious problem af...