29 search results - page 1 / 6 » Convolutional Compaction of Test Responses |
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper introduces a finite memory compactor called convolutional compactor that provides compaction ratios of test responses in excess of 100x even for a very small number of ...
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
This paper addresses the problem of test response compaction. In order to maximize compaction ratio, a single-output encoder based on check matrix of a (n, n1, m, 3) convolutional...
ICCAD
2005
IEEE
14 years 1 months ago
2005
IEEE
The presence of unknown values in the simulation result is a key barrier to effective output response compaction in practice. This paper proposes a simple circuit module, called a...
ICCD
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper proposes a response compactor, named ChiYun compactor, to compact scan-out responses in the presence of unknown values. By adding storage elements into an Xor network, ...
TC
1998
13 years 4 months ago
1998
—Many built-in self-testing (BIST) schemes compress the test responses from a k-output circuit to q signature streams, where q << k, a process termed space compaction. The ...