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ICCAD
2006
IEEE
183views Hardware» more  ICCAD 2006»
14 years 1 months ago
Soft error derating computation in sequential circuits
Soft error tolerant design becomes more crucial due to exponential increase in the vulnerability of computer systems to soft errors. Accurate estimation of soft error rate (SER), ...
Hossein Asadi, Mehdi Baradaran Tahoori
VLSID
2009
IEEE
87views VLSI» more  VLSID 2009»
14 years 5 months ago
Soft Error Rates with Inertial and Logical Masking
We analyze the neutron induced soft error rate (SER). An induced error pulse is modeled by two parameters, probability of occurrence and probability density function of the pulse ...
Fan Wang, Vishwani D. Agrawal
DSN
2008
IEEE
13 years 6 months ago
An accurate flip-flop selection technique for reducing logic SER
The combination of continued technology scaling and increased on-chip transistor densities has made vulnerability to radiation induced soft errors a significant design concern. In...
Eric L. Hill, Mikko H. Lipasti, Kewal K. Saluja
ISQED
2010
IEEE
128views Hardware» more  ISQED 2010»
13 years 10 months ago
Soft error rate determination for nanoscale sequential logic
We analyze the neutron induced soft error rate (SER) by modeling induced error pulse using two parameters, occurrence frequency and probability density function for the pulse widt...
Fan Wang, Vishwani D. Agrawal
ICCD
2008
IEEE
157views Hardware» more  ICCD 2008»
14 years 1 months ago
Power-aware soft error hardening via selective voltage scaling
—Nanoscale integrated circuits are becoming increasingly sensitive to radiation-induced transient faults (soft errors) due to current technology scaling trends, such as shrinking...
Kai-Chiang Wu, Diana Marculescu