4 search results - page 1 / 1 » Cost-Effective Concurrent Test Hardware Design for Linear An... |
ICCD
2002
IEEE
13 years 9 months ago
2002
IEEE
Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for the automatic desi...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
We present a novel methodology for concurrent error detection in linear analog circuits. We develop a rigorous theory that yields an error detection circuit of size that is, in ge...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
—A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
We present a novel analog checker that adjusts dynamically the error threshold to the magnitude of its input signals. We demonstrate that this property is crucial for accurate con...