27 search results - page 2 / 6 » Cost-free scan: a low-overhead scan path design |
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
In a scan-based system with a large number of flip-flops, a major component of power is consumed during scanshift and clocking operation in test mode. In this paper, a novel scan-...
ATS
1996
IEEE
13 years 8 months ago
1996
IEEE
In this paper, we present a novel and efticient approach to test MCM at the module as well as chip levels. Our design incorporates the concept of the multifrequency test method an...
DAC
1996
ACM
13 years 8 months ago
1996
ACM
We propose a low-overhead scan design methodology which employs a new test point insertion technique to establish scan paths through the functional logic. The technique re-uses th...
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
It has been proven that scan path is a potent hazard for secure chips. Scan based attacks have been recently demonstrated against DES or AES and several solutions have been presen...
TCAD
1998
13 years 4 months ago
1998
—Conventional scan design imposes considerable area and delay overheads. To establish a scan chain in the test mode, multiplexers at the inputs of flip-flops and scan wires are...