58 search results - page 1 / 12 » Critical path analysis using a dynamically bounded delay mod... |
DAC
2000
ACM
14 years 5 months ago
2000
ACM
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
Transient Signal Analysis (TSA) is a Go/No-Go device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, a technique based o...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
IFM
2009
Springer
13 years 11 months ago
2009
Springer
We present the new technique of dynamic path reduction (DPR), which allows one to prune redundant paths from the state space of a program under verification. DPR is a very general...