7 search results - page 1 / 2 » Deep Submicron Technology: Opportunity or Dead End for Dynam... |
VLSID
2007
IEEE
14 years 5 months ago
2007
IEEE
ISCAS
1999
IEEE
13 years 9 months ago
1999
IEEE
-- Noise in deep submicron technology combined with the move towards dynamic circuit techniques for higher performance have raised concerns about reliability and energyefficiency o...
ASPDAC
2005
ACM
13 years 10 months ago
2005
ACM
The progressive trend of fabrication technologies towards the nanometer regime has created a number of new physical design challenges for computer architects. Design complexity, u...
IOLTS
2006
IEEE
13 years 11 months ago
2006
IEEE
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...
ISQED
2007
IEEE
13 years 11 months ago
2007
IEEE
The deep submicron (DSM) semiconductor technologies will make the worst-case design impossible, since they can not provide design margins that it requires. Research directions sho...