3 search results - page 1 / 1 » Defect Tolerance at the End of the Roadmap |
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Defect tolerance will become more important as feature sizes shrink closer to single digit nanometer dimensions. This is true whether the chips are manufactured using topdown meth...
MICRO
2010
IEEE
13 years 2 months ago
2010
IEEE
Single-thread performance, reliability and power efficiency are critical design challenges of future multicore systems. Although point solutions have been proposed to address thes...
TASE
2008
IEEE
13 years 4 months ago
2008
IEEE
Applications such as layered manufacturing, or in general, solid free-form fabrication, pose a major challenge on online process control. For these parts to be functional, it is i...