138 search results - page 27 / 28 » Delay modeling and static timing analysis for MTCMOS circuit... |
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...
GLVLSI
2005
IEEE
13 years 10 months ago
2005
IEEE
We perform a detailed study of various crosstalk scenarios in VDSM technologies by using a distributed model of the crosstalk site and make a number of key observations about the ...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
VLSID
2006
IEEE
13 years 11 months ago
2006
IEEE
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
DAC
2008
ACM
14 years 5 months ago
2008
ACM
A fundamental problem in timing-driven physical synthesis is the reduction of critical paths in a design. In this work, we propose a powerful new technique that moves (and can als...