88 search results - page 1 / 18 » Design for manufacturability in submicron domain |
ICCAD
1996
IEEE
13 years 9 months ago
1996
IEEE
- Key characteristics of newly emerging IC technologies render the traditional concept of die size minimization and traditional "design rules" insufficient to handle the ...
DAC
2000
ACM
14 years 5 months ago
2000
ACM
The use of deep submicron process technologies presents several new challenges in the area of manufacturing test. While a significant body of work has been devoted to identifying ...
VLSID
2002
IEEE
14 years 5 months ago
2002
IEEE
Abstract - The deep sub-micron regime has broughtup several manufacturing issues which impact circuit-performance and design. One such issue is flaring of transistors which causes ...
DFT
1999
IEEE
13 years 9 months ago
1999
IEEE
This paper describes the yield estimation approach to layout scaling of submicron VLSI circuits. The presented method makes it feasible to find scaling factor of the IC design whi...
CORR
2007
Springer
13 years 4 months ago
2007
Springer
: The research area “Virtual Manufacturing” can be defined as an integrated manufacturing environment which can enhance one or several levels of decision and control in manufac...