37 search results - page 2 / 8 » Design of a Robust 8-Bit Microprocessor to Soft Errors |
DAC
2005
ACM
13 years 7 months ago
2005
ACM
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
DSD
2009
IEEE
14 years 15 days ago
2009
IEEE
Feature sizes in VLSI circuits are steadily shrinking. This results in increasing susceptibility to soft errors, e.g. due to environmental radiation. Precautions against soft error...
MICRO
2010
IEEE
13 years 3 months ago
2010
IEEE
Soft error reliability is increasingly becoming a first-order design concern for microprocessors, as a result of higher transistor counts, shrinking device geometries and lowering ...
TCAD
2008
13 years 5 months ago
2008
Soft-error induced reliability problems have become a major challenge in designing new generation microprocessors. Due to the on-chip caches' dominant share in die area and tr...
PATMOS
2007
Springer
13 years 12 months ago
2007
Springer
—Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the...