16 search results - page 1 / 4 » Deterministic BIST with Partial Scan |
ET
2000
13 years 4 months ago
2000
An efficient deterministic BIST scheme based on partial scan chains together with a scan selection algorithm tailored for BIST is presented. The algorithm determines a minimum num...
ITC
1998
IEEE
13 years 9 months ago
1998
IEEE
A deterministic BIST scheme for circuits with multiple scan paths is presented. A procedure is described for synthesizing a pattern generator which stimulates all scan chains simu...
ITC
1995
IEEE
13 years 8 months ago
1995
IEEE
ET
2002
13 years 4 months ago
2002
In this paper a novel architecture for scan-based mixed mode BIST is presented. To reduce the storage requirements for the deterministic patterns it relies on a two-dimensional co...
DT
2002
13 years 4 months ago
2002