30 search results - page 1 / 6 » Diagnosis of Hold Time Defects |
ICCD
2004
IEEE
14 years 1 months ago
2004
IEEE
In modern technologies, process variations can be quite substantial, often causing design timing failures. It is essential that those errors be correctly and quickly diagnosed. In...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
Abstract — This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect d...
CATA
2001
13 years 6 months ago
2001
This paper is part of a larger study of remote print defect diagnosis. The goals of the integrated print defect diagnosis system are to reduce diagnosis time, streamline communica...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
— In this paper, we study the problem of delay defect diagnosis based on statistical timing models. We propose a diagnosis algorithm that can effectively utilize statistical timi...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Scan chain defect diagnosis is important to silicon debug and yield enhancement. Traditional simulationbased chain diagnosis algorithms may take long run time if a large number of...