19 search results - page 2 / 4 » Diagnosis of Realistic Defects Based on the X-Fault Model |
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Failure analysis (FA) and diagnosis of memory cores plays a key role in system-on-chip (SOC) product development and yield ramp-up. Conventional FA based on bitmaps and the experi...
IIS
2000
13 years 6 months ago
2000
The Hepar II system is based on a Bayesian network model of a subset of the domain of hepatology in which the structure of the network is elicited from an expert diagnostician and ...
DKE
2010
13 years 5 months ago
2010
Workflow analysis is indispensable to capture modeling errors in workflow designs. While several workflow analysis approaches have been defined previously, these approaches do not...
DAC
2000
ACM
14 years 6 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
ATS
2010
IEEE
13 years 3 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...