8 search results - page 2 / 2 » Divide-and-Conquer IDDQ Testing for Core-Based System Chips |
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
SBCCI
2003
ACM
13 years 10 months ago
2003
ACM
Network on Chip (NoC) is a new paradigm for designing core based System on Chips. It supports high degree of reusability and is scalable. In this paper, an efficient Two-Step Gene...
VLSI
2005
Springer
13 years 10 months ago
2005
Springer
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...