19 search results - page 2 / 4 » Dynamic power estimation for deep submicron circuits with pr... |
ISLPED
1995
ACM
13 years 9 months ago
1995
ACM
When estimating the dynamic power dissipated by a circuit di erent methods ranging from numeric analog simulation to event-driven logic simulation have been proposed. However, as ...
ISQED
2007
IEEE
13 years 12 months ago
2007
IEEE
The deep submicron (DSM) semiconductor technologies will make the worst-case design impossible, since they can not provide design margins that it requires. Research directions sho...
IOLTS
2006
IEEE
13 years 11 months ago
2006
IEEE
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...
ISCAS
2005
IEEE
13 years 11 months ago
2005
IEEE
—As process variations become a significant problem in deep sub-micron technology, a shift from deterministic static timing analysis to statistical static timing analysis for hig...
VTS
2002
IEEE
13 years 10 months ago
2002
IEEE
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...