—Static and dynamic variations, which have negative impact on the reliability of microelectronic systems, increase with smaller CMOS technology. Thus, further downscaling is only...
Matthias May, Norbert Wehn, Abdelmajid Bouajila, J...
Abstract—Continuously reducing transistor sizes and aggressive low power operating modes employed by modern architectures tend to increase transient error rates. Concurrently, mu...
Isil Oz, Haluk Rahmi Topcuoglu, Mahmut T. Kandemir...
Probabilistic arithmetic, where the ith output bit of addition and multiplication is correct with a probability pi, is shown to be a vehicle for realizing extremely energy-efficie...
Jason George, B. Marr, Bilge E. S. Akgul, Krishna ...
With technology scaling, manufacture-time and in-field permanent faults are becoming a fundamental problem. Multi-core architectures with spares can tolerate them by detecting an...
Shuou Nomura, Matthew D. Sinclair, Chen-Han Ho, Ve...
Writing shared-memory parallel programs is error-prone. Among the concurrency errors that programmers often face are atomicity violations, which are especially challenging. They h...
Brandon Lucia, Joseph Devietti, Karin Strauss, Lui...