12 search results - page 1 / 3 » Effectiveness and scaling trends of leakage control techniqu... |
ISLPED
2003
ACM
13 years 10 months ago
2003
ACM
VLSID
2007
IEEE
14 years 5 months ago
2007
IEEE
With scaling of CMOS technologies, sub-threshold, gate and reverse biased junction band-to-band-tunneling leakage have increased dramatically. Together they account for more than 2...
VLSID
2006
IEEE
14 years 5 months ago
2006
IEEE
For a nanoCMOS of sub-65nm technology, where the gate oxide (SiO2) thickness is very low, the gate leakage is one of the major components of power dissipation. In this paper, we pr...
CASES
2006
ACM
13 years 10 months ago
2006
ACM
Rising interest in the applications of wireless sensor networks has spurred research in the development of computing systems for lowthroughput, energy-constrained applications. Un...
GLVLSI
2009
IEEE
13 years 8 months ago
2009
IEEE
In this paper, we present the design of a P4 (Power-PerformanceProcess-Parasitic) aware voltage controlled oscillator (VCO) at nanoCMOS technologies. Through simulations, we have ...