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» Efficient Embedding of Deterministic Test Data
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TVLSI
2008
133views more  TVLSI 2008»
13 years 5 months ago
Test Data Compression Using Selective Encoding of Scan Slices
We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...
Zhanglei Wang, Krishnendu Chakrabarty
COCOON
2007
Springer
13 years 9 months ago
Efficient Testing of Forecasts
Each day a weather forecaster predicts a probability of each type of weather for the next day. After n days, all the predicted probabilities and the real weather data are sent to a...
Ching-Lueh Chang, Yuh-Dauh Lyuu
DATE
2004
IEEE
131views Hardware» more  DATE 2004»
13 years 9 months ago
Efficient Modular Testing of SOCs Using Dual-Speed TAM Architectures
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...
Anuja Sehgal, Krishnendu Chakrabarty
FLAIRS
2004
13 years 7 months ago
Inducing Fuzzy Decision Trees in Non-Deterministic Domains using CHAID
Most decision tree induction methods used for extracting knowledge in classification problems are unable to deal with uncertainties embedded within the data, associated with human...
Jay Fowdar, Zuhair Bandar, Keeley A. Crockett
ITC
1998
IEEE
71views Hardware» more  ITC 1998»
13 years 10 months ago
A structured and scalable mechanism for test access to embedded reusable cores
The main objective of core-based IC design is improvement of design efficiency and time-to-market. In order to prevent test development from becoming the bottleneck in the entire ...
Erik Jan Marinissen, Robert G. J. Arendsen, Gerard...